The present invention relates to a shooting mask (II) mainly comprising a mask main body worn on the user's face; a glass holder disposed to the mask main body, wherein a connection portion is disposed between the mask main body and the face; and a pad body, wherein a surface of the pad body corresponding to the connection portion has a protruding portion, and the protruding portion is fastened to...

This invention relates to a light field compensation method for segment projection grating measurement, and the equipment thereof. It comprises the following procedures: (1) Preparation step. (2) Generation of non-grating image step. (3) Generation of grating image step. (4) Image combination and compensation step. (5) Projection and image acquisition step. (6) Three-dimensional outline analysis a...

An electro-magnetic wave distance measurement and its distant shielding method are suitable for measuring the distance of an object. The system consists of a transceiving unit that emits electromagnetic wave to the object and receives the reflecting wave at least a measuring scale length and a processing unit that obtains a first amplitude, a second amplitude, a third amplitude and a first distanc...

A position detection error correcting method that corrects position detection errors using a limited storage capacity, by calculating position detection error correction values by four simple arithmetic operations at startup to reduce a startup time delay and consumption of a storage capacity even when a portion containing steep error variations exists. Detection error correction values of a posit...

A light spot detection system and method, characterized by the use of an interference device for defining a specific spectrum range of optical band that can be received and detected by a detection device of the system, in which the detection device is enabled to detect a frame of image and thus generate and transmit signals corresponding to the detected frame to a computer where the image signals ...

It is characterized by comprising a turntable having placed thereon a semiconductor wafer having a reference notch for prealignment purposes formed in the outer peripheral edge thereof, the turntable rotating the semiconductor wafer, a light throwing means disposed normal to the surface of the semiconductor wafer for radiating testing light to test for defects in the outer peripheral edge of the s...

Provided is a system and a method for measuring the junction temperature and the thermal resistance of a light emitting diode. The method includes the following steps of: (a) thermally equilibrating LED's outer shell; (b) synchronously capturing the forward voltage drop and the light output power for the LEDs on the condition of different forward currents and outer shell temperatures; (c) receivin...

The meter e.g. for measuring the glucose content of a blood sample, comprises housing 11 containing a lancet 13 for puncturing the skin and associated drive means, a cartridge containing test strips, a sensor for analysing a fluid test sample received on a test strip and a strip dispensing system for the movement of a test strip from the cartridge to a sample receiving position in which the test s...

This invention describes a quantitative, inexpensive, disposable immunosensor that requires no wash steps and thus generates no liquid waste. Moreover, in preferred embodiments of the sensor no timing steps are required of the user, and the sensor can be readily adapted to antigen-antibody interactions over a wide kinetic range.

A method for measuring a liquid immersion lithography soluble fraction in an organic film including a mounting step of mounting a droplet of a liquid immersion medium for liquid immersion lithography on a surface of an organic film formed on a substrate; and a transfer step of transferring a component in the organic film into the droplet.

An inspecting method which is for a microstructure with a movable portion and executes a highly precise inspection without damaging a probe or an inspection electrode by suppressing the effect of a needle pressure in contacting the probe to the inspection electrode is provided. When inspection on a microstructure is performed, first, a pair of probes (2) are caused to contact respective electrode...

An apparatus and method for testing an integrated circuit in a target electronic application, wherein the apparatus includes a socket for receiving the integrated circuit, a modified commercial electronic product which models the target electronic application, and an electrical connection between the socket and the modified commercial electronic product. The method of testing an integrated circuit...

A test apparatus 10 according to the present invention includes: a plurality of test modules 150, connected to either of the plurality of devices under test 100, for supplying a test signal to the connected device under test 100; a plurality of control apparatuses 130 for controlling the plurality of test modules 150, and for testing the plurality of devices under test 100 in parallel; and a conne...

Voltage glitch detection circuits and methods thereof. The voltage glitch detection circuit may include a monitoring memory array including at least one memory cell storing reference data, a monitoring sense amplifier receiving stored reference data from the monitoring memory array, amplifying the received stored reference data in response to an operation control signal and outputting data based o...

An ultra wide angle imaging optical system includes, in order from an object side, a first lens group, an aperture stop, and a second lens group. The first lens group includes, in order from the position closest to the object side, a negative meniscus lens element convex to the object side, a negative lens element, and a negative lens element. The second lens group includes a plurality of positive...

A fixed-focus lens includes a first lens group and a second lens group both with positive refractive power is provided. The first lens group is composed of a first lens and a second lens arranged in order that from an object side to an image side. The second lens group disposed between the first lens group and the image side is composed of a third lens, a fourth lens and a fifth lens arranged in o...

A system and a method of the optical delay line are disclosed. The system of optical delay line comprises a light source and an array of mirrors comprising a first reflection mirror, a second reflection mirror, a third reflection mirror and a fourth reflection mirror, wherein a light from the light source is reflected repeatedly by the mirrors so as to result the optical delay line.