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1 JP1035928A
SEMICONDUCTOR INSPECTION DEVICE
07.02.1989
2 JP1035949A
METHOD OF CONTROLLING ELECTRICALLY CONTINUOUS STATE OF MOS TRANSISTOR AND INTEGRATED CIRCUIT OBTAINED BY APPLYING THE METHOD

The conduction state of a MOS transistor 11 is definitively controlled with a laser beam 21 by forming an electrical connection 22 between the gate 16 and the underlying portion d of the source 14 or drain 15 region. The invention applies in particular to the correcting of integrated circuits (reconfiguration, redundancy) and to the programming of integrated read-only memories.

07.02.1989
3 JP1035952A
MANUFACTURE OF SEMICONDUCTOR DEVICE
07.02.1989
4 JP1035957A
SEMICONDUCTOR INTEGRATED CIRCUIT AND MANUFACTURE THEREOF
07.02.1989
5 JP1035964A
ULTRAVIOLET-RAY ERASABLE NONVOLATILE SEMICONDUCTOR DEVICE

An ultraviolet erasable nonvolatile semiconductor device has a floating gate (13), a control gate (18), and a gate insulating layer (17) interlayered between the floating gate and the control gate. The interlayered gate insulating layer (17) consists of three layers, a first silicon oxide layer (14), a silicon nitride layer (15) layered on the first silicon oxide layer, and a second silicon oxide ...

07.02.1989
6 JP1035981A
CERAMIC CIRCUIT BOARD
07.02.1989
7 JP1036001A
ELECTRIC FILM RESISTOR AND ITS MANUFACTURE

An electric laminar resistor wherein a thin metal film is applied to a ceramic substrate. Metal film material is removed to form a resistance track and recessed connecting zones at opposite ends of the track. A burnt-in thick layer paste extends through the connecting zone recesses and solidified to form connecting elements that are adhered to the substrate. A metal powder and glass frit coating i...

07.02.1989
8 JP1036010A
CAPACITOR EQUIPPED WITH PROTECTIVE DEVICE
07.02.1989
9 JP1036023A
DRY ETCHING
07.02.1989
10 JP1036031A
SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF

A semiconductor device includes at least one wiring layer (16, 23) containing aluminum as the major constituent and provided through an insulating film (12) on a semiconductor substrate on which components or elements are formed, and a heat resistant high molecular organic film (13) having a radical of small water absorbing property provided on side surfaces of the wiring layer. The heat resisting...

07.02.1989
11 JP1036040A
PARAMETRIC INSPECTION APPARATUS FOR SEMICONDUCTOR DEVICE
07.02.1989
12 JP1036043A
PACKAGE

A sealable contamination proof container package bottom and top for storing and transporting a plurality of silicon wafers in a wafer carrier. The package bottom includes four sides, a continuous vertical surface for tape sealing surrounding the four sides, a lip positioned on a vertical edge, opposing hook latches on opposing sides, opposing hand grip recesses on the opposing sides and a raised b...

07.02.1989
13 JP1036052A
SEMICONDUCTOR DEVICE
07.02.1989
14 JP1036053A
SEMICONDUCTOR DEVICE
07.02.1989
15 JP1036054A
SEMICONDUCTOR DEVICE
07.02.1989
16 JP1036070A
MANUFACTURE OF BIPOLAR TRANSISTOR
07.02.1989
17 JP1036071A
BIPOLAR TRANSISTOR AND MANUFACTURE THEREOF
07.02.1989
18 JP1036078A
FIELD-EFFECT TRANSISTOR
07.02.1989
19 JP1036088A
PHOTOELECTRIC CONVERSION DEVICE
07.02.1989
20 JP1036095A
WIRING BOARD
07.02.1989